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PMIC - Supervisors

PMIC - Supervisors

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  2. Integrated Circuits (ICs)
  3. PMIC - Supervisors
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Image Part Number Manufacturer Description Series Operating Temperature Packaging Mounting Type Voltage - Supply Output Type Accuracy Sensor Type Package / Case
X5043M8 Intersil IC CPU SUPRV 4K EE RST LO 8MSOP - 0°C ~ 70°C (TA) Tube Surface Mount - - - - 8-TSSOP, 8-MSOP (0.118", 3.00mm Width)
MAX16005ETE+ Maxim Integrated IC UP SUPERVISOR HEX 16-TQFN - -40°C ~ 125°C (TA) Tube Surface Mount - - - - 16-WQFN Exposed Pad
MCP101-300DI/TO Micrel / Microchip Technology IC SUPERVISOR 3.00V HIGH TO92 - -40°C ~ 85°C (TA) Bulk Through Hole - - - - TO-226-3, TO-92-3 (TO-226AA)
LTC2916HDDB-1#TRMPBF ADI (Analog Devices, Inc.) IC VOLT SUPERVISOR 8-DFN - -40°C ~ 125°C (TA) Cut Tape (CT) Surface Mount - - - - 8-WFDFN Exposed Pad
S-80149ALMC-JBAT2U SII Semiconductor Corporation IC VOLT DETECTOR 4.9V SOT23-5 S-801 -40°C ~ 85°C (TA) Tape & Reel (TR) Surface Mount - - - - SC-74A, SOT-753
TPS3839K33DBZT N/A IC LP SUPERVISRY CIRCUIT SOT23-3 - -40°C ~ 85°C (TA) Tape & Reel (TR) Surface Mount - - - - TO-236-3, SC-59, SOT-23-3
X5083S8IZ-2.7 Intersil IC SUPERVISOR CPU 8K EE 8-SOIC - -40°C ~ 85°C (TA) Tube Surface Mount - - - - 8-SOIC (0.154", 3.90mm Width)
X40414S8-B Intersil IC VOLTAGE MON DUAL W/SUP 8-SOIC - 0°C ~ 70°C (TA) Tube Surface Mount - - - - 8-SOIC (0.154", 3.90mm Width)
MCP130T-475I/TT Micrel / Microchip Technology IC SUPERVISOR 4.75V LOW SOT23 - -40°C ~ 85°C (TA) Tape & Reel (TR) Surface Mount - - - - TO-236-3, SC-59, SOT-23-3
MCP101-485DI/TO Micrel / Microchip Technology IC SUPERVISOR 4.85V HIGH TO92 - -40°C ~ 85°C (TA) Bulk Through Hole - - - - TO-226-3, TO-92-3 (TO-226AA)

About PMIC - Supervisors


PMIC supervisors are integrated circuits that monitor system voltages, currents, and temperatures to ensure proper functioning and safety of electronic systems. They provide functions such as voltage monitoring, reset generation, and power-on sequencing to guarantee stable operation and prevent system malfunctions or damage due to voltage fluctuations or power failures.